Nội dung text 33. X-RAY DIFFRACTION.pdf
PHARMD GURU Page 3 When the wavelength of the radiation is comparable with or smaller than the lattice constant, one can find diffracted beams in directions quite different from the incident radiation. The structure of a crystal can be determined by studying the diffraction pattern of a beam of radiation incident on the crystal. Beam diffraction takes place only in certain specific directions, much as light is diffracted by a grating. By measuring the directions of the diffraction and the corresponding intensities, one obtains information concerning the crystal structure responsible for diffraction. PRINCIPLE: X-ray diffraction is based on constructive interference of monochromatic X- rays and a crystalline sample. These X-rays are generated by a cathode ray tube, filtered to produce monochromatic radiation, collimated to concentrate, and directed toward the sample. The interaction of the incident rays with the sample produces constructive interference (and a diffracted ray) when conditions satisfy Bragg's Law (nλ = 2d sinθ). This law relates the wavelength of electromagnetic radiation to the diffraction angle and the lattice spacing in a crystalline sample. These diffracted X-rays are then detected, processed and counted. By scanning the sample through a range of 2θ angles, all possible diffraction directions of the lattice should be attained due to the random orientation of the powdered material. Conversion of the diffraction peaks to d-spacings allows identification of the mineral because each mineral has a set of unique d-spacings. Typically, this is achieved by comparison of d-spacings with standard reference patterns. All diffraction methods are based on generation of X-rays in an X-ray tube. These X-rays are directed at the sample, and the diffracted rays are collected. A key component of all diffraction is the angle between the incident and diffracted rays.